Predictive analysis of drifting test cases and critical areas for enhancing embedded systems using a Gaussian distribution methodology for multi-output analysis

M.Lakshmi Prasad; R.Obulakonda Reddy; Sandeep Kautish; G.Suresh Reddy; Abdulaziz S. Almazyad; Ali Wagdy Mohamed; Seyed Jalaleddin Mousavirad

doi:10.1016/j.eij.2025.100857

Q1 2026

Predictive analysis of drifting test cases and critical areas for enhancing embedded systems using a Gaussian distribution methodology for multi-output analysis

M.Lakshmi Prasad · R.Obulakonda Reddy · Sandeep Kautish · G.Suresh Reddy · Abdulaziz S. Almazyad · Ali Wagdy Mohamed · Seyed Jalaleddin Mousavirad

10.1016/j.eij.2025.100857 384 Views 1 Citations

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Cite this Article (APA)

M.Lakshmi, P., R.Obulakonda, R., Sandeep, K., G.Suresh, R., Abdulaziz, S. A., Ali, W. M., Seyed, J. M. (2026). Predictive analysis of drifting test cases and critical areas for enhancing embedded systems using a Gaussian distribution methodology for multi-output analysis. Egyptian Informatics Journal. https://doi.org/10.1016/j.eij.2025.100857