Open-world scanning electron microscope nano-defect category discovery via self-normal prototypes

Botong Zhao; Fang Yu; Xubin Wang; Shujing Lyu; Yue Lu

doi:10.1007/s44443-026-00893-2

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391

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Cite this Article (APA)

Botong, Z., Fang, Y., Xubin, W., Shujing, L., Yue, L. (2026). Open-world scanning electron microscope nano-defect category discovery via self-normal prototypes. Journal of King Saud University - Computer and Information Sciences. https://doi.org/10.1007/s44443-026-00893-2

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