An Intelligent Framework-Based Wavelet Entropy for Reliable Fault Detection in Multi-Terminal HVDC Systems

Xinxin Wu; Zewen Li; Yulong Liu; Weiming Ni; Tao Jin; Mohamed A. Mohamed

doi:10.1007/s13369-026-11168-3

10.1007/s13369-026-11168-3 386 المشاهدات 0 الاقتباسات

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386

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الاستشهاد بهذا المقال (APA)

Xinxin, W., Zewen, L., Yulong, L., Weiming, N., Tao, J., Mohamed, A. M. (2026). An Intelligent Framework-Based Wavelet Entropy for Reliable Fault Detection in Multi-Terminal HVDC Systems. Arabian Journal for Science and Engineering. https://doi.org/10.1007/s13369-026-11168-3

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